Software defect prediction: do different classifiers find the same defects?
David BowesTracy HallJean PetricPublished in: Softw. Qual. J. (2018)
Keyphrases
- software defect prediction
- ensemble learning
- feature ranking
- imbalanced data
- feature selection
- support vector
- ensemble classifier
- machine learning algorithms
- ensemble methods
- random forest
- decision trees
- naive bayes
- generalization ability
- machine learning
- class imbalance
- training examples
- feature set
- concept drift
- linear classifiers
- semi supervised learning
- training data
- pairwise