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Reliability Limits of TMR Implemented in a SRAM-based FPGA: Heavy Ion Measures vs. Fault Injection Predictions.

Gilles FoucardPaul PeronnardRaoul Velazco
Published in: J. Electron. Test. (2011)
Keyphrases
  • fault injection
  • low cost
  • java card
  • high speed
  • hardware implementation
  • reconfigurable hardware
  • confidence levels
  • energy consumption
  • low power
  • power reduction
  • pipelined architecture