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Innovative Test Solutions for Pin-Limited Microcontrollers.

Matthew G. StoutKenneth P. Tumin
Published in: ISQED (2008)
Keyphrases
  • hardware and software
  • data sets
  • image processing
  • information technology
  • neural network
  • data mining
  • social networks
  • computer vision
  • feature selection
  • web services
  • multiscale
  • special case