Trends and Challenges in VLSI Circuit Reliability.

Cristian Constantinescu

Published in: IEEE Micro (2003)

Keyphrases

high speed
vlsi circuits
open issues
lessons learned
key issues
real world
signal processing
database
future trends
gate array
chip design
pattern recognition
analog vlsi
circuit design
technical challenges
trend analysis
power dissipation
single chip
power consumption
image processing
neural network
data sets