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Faulty or Ready? Handling Failures in Deep-Learning Computer Vision Models until Deployment: A Study of Practices, Challenges, and Needs.
Agathe Balayn
Natasa Rikalo
Jie Yang
Alessandro Bozzon
Published in:
CHI (2023)
Keyphrases
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deep learning
computer vision
machine learning
image processing
object detection
model selection
deep architectures
bayesian networks
pairwise
probabilistic model
d objects
markov random field
maximum likelihood
unsupervised feature learning