Comparison of Impedance Matching Networks for Scanning Microwave Microscopy.

Johannes Hoffmann Sophie De Préville Bruno Eckmann Hung-Ju Lin Benedikt Herzog Kamel Haddadi Didier Théron Georg Gramse Damien Richert José Morán-Meza François Piquemal

Published in: IEEE Trans. Instrum. Meas. (2024)

Keyphrases