An Improved Industrial Control System Device Logs Processing Method for Process-Based Anomaly Detection.

Mukhtar Hussain Ernest Foo Suriadi Suriadi

Published in: FIT (2019)

Keyphrases

anomaly detection
control system
one class support vector machines
intrusion detection
data sets
feature extraction
similarity measure
training data
pairwise
support vector machine
computer systems
self organizing maps
process control
computer security
anomalous behavior