• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Two novel ELM-based stacking deep models focused on image recognition.

Gang SongQun DaiXiaomeng HanLin Guo
Published in: Appl. Intell. (2020)
Keyphrases
  • image recognition
  • computer vision
  • probabilistic model
  • image classification
  • statistical models
  • neural network
  • learning algorithm
  • feature extraction
  • model selection
  • neural network model
  • combining multiple