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Two novel ELM-based stacking deep models focused on image recognition.

Gang SongQun DaiXiaomeng HanLin Guo
Published in: Appl. Intell. (2020)
Keyphrases
  • image recognition
  • computer vision
  • probabilistic model
  • image classification
  • statistical models
  • neural network
  • learning algorithm
  • feature extraction
  • model selection
  • neural network model
  • combining multiple