Computerized Ultrasonic Imaging Inspection: From Shallow to Deep Learning.
Jiaxing YeShunya ItoNobuyuki ToyamaPublished in: Sensors (2018)
Keyphrases
- deep learning
- synthetic aperture
- unsupervised feature learning
- unsupervised learning
- machine learning
- mental models
- image processing
- high resolution
- computer vision
- deep architectures
- restricted boltzmann machine
- question answering
- training data
- weakly supervised
- markov random field
- natural language processing
- viewpoint
- feature extraction
- information retrieval