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Study on maximum electric field modeling used for HCI induced degradation characteristic of LDMOS transistors.

Masashi HigashinoHitoshi AokiNobukazu TsukijiMasaki KazumiTakuya TotsukaHaruo Kobayashi
Published in: ASICON (2015)
Keyphrases
  • electric field
  • data sets
  • website
  • human computer interaction
  • real time
  • databases
  • machine learning
  • learning environment
  • empirical studies
  • theoretical framework
  • power consumption