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Application of reliability-based automatic repeat request to multi-class classification for brain-computer interfaces.

Hiromu TakahashiTomohiro YoshikawaTakeshi Furuhashi
Published in: FUZZ-IEEE (2009)
Keyphrases
  • multi class classification
  • brain computer interface
  • multi class
  • machine learning
  • markov random field
  • binary classification
  • training data
  • multi class boosting