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An Approach for In-House USB2.0 Electrical Compliance Testing on Nanoscale SoC.

Maneesh Kumar PandeyShwetank ShekharNitin SaxenaGaurav Kumar AgarwalAmersh Kumar
Published in: MTV (2013)
Keyphrases
  • test set
  • smart card
  • database
  • neural network
  • data mining
  • database systems
  • high speed
  • data transmission
  • power grid