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PIM-linearity improvement by the size of a diode mounting hole.

Kenji IrieNobuhiro KugaKeizo Cho
Published in: IEICE Electron. Express (2011)
Keyphrases
  • scales linearly
  • database
  • learning algorithm
  • significant improvement
  • neural network
  • machine learning
  • metadata
  • data streams
  • standard deviation
  • fixed size
  • light emitting