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A Deep Learning Method for Improving the Classification Accuracy of SSMVEP-Based BCI.

Zhongke GaoTao YuanXinjun ZhouChao MaKai MaPan Hui
Published in: IEEE Trans. Circuits Syst. (2020)
Keyphrases
  • deep learning
  • pairwise
  • similarity measure
  • object recognition
  • high dimensional
  • probabilistic model