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Impedance Measurement With Sine-Fitting Algorithms Implemented in a DSP Portable Device.
Tomás Radil
Pedro M. Ramos
A. Cruz Serra
Published in:
IEEE Trans. Instrum. Meas. (2008)
Keyphrases
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computationally expensive
learning algorithm
recently developed
bayesian networks
significant improvement
worst case
graph theory
digital signal processing
image sequences
face recognition
computational cost
least squares
orders of magnitude
times faster