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When a Patch Goes Bad: Exploring the Properties of Vulnerability-Contributing Commits.

Andrew MeneelyHarshavardhan SrinivasanAyemi MusaAlberto Rodriguez TejedaMatthew MokaryBrian Spates
Published in: ESEM (2013)
Keyphrases
  • user interface
  • desirable properties
  • image patches
  • real time
  • wide range
  • structural properties
  • data sets
  • real world
  • learning algorithm
  • metadata
  • multimedia
  • database systems
  • information technology