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High-channel-count impedance spectroscopy logger.

Frederick PothofK. SharmaOliver PaulPatrick Ruther
Published in: NER (2017)
Keyphrases
  • x ray
  • infrared
  • wide range
  • multi channel
  • case study
  • computer simulation
  • multiple access
  • hidden markov models
  • image quality
  • remote sensing
  • channel capacity