Login / Signup
Analysis of the dependence of indium-gallium-zinc oxide thin-film transistor properties on the gate interface material using a two-stack gate-insulator structure.
Jae-Chul Park
Tae Kwang Park
Ho-Nyeon Lee
Published in:
Displays (2015)
Keyphrases
</>
room temperature
thin film transistor
user interface
wireless sensor networks