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Analysis of the dependence of indium-gallium-zinc oxide thin-film transistor properties on the gate interface material using a two-stack gate-insulator structure.

Jae-Chul ParkTae Kwang ParkHo-Nyeon Lee
Published in: Displays (2015)
Keyphrases
  • room temperature
  • thin film transistor
  • user interface
  • wireless sensor networks