Density in 65-nm CMOS.

Guodong Yin Yiming Chen Mufeng Zhou Wenjun Tang Mingyen Lee Zekun Yang Tianyu Liao Xirui Du Vijaykrishnan Narayanan Huazhong Yang Hongyang Jia Yongpan Liu Xueqing Li

Published in: IEEE J. Solid State Circuits (2024)

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