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A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization.
Luís Alexandre Rocha
Lukas Mol
Edmond Cretu
Reinoud F. Wolffenbuttel
José Machado da Silva
Published in:
VLSI Design (2008)
Keyphrases
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real time
machine learning
multiscale
neural network
information retrieval
artificial intelligence
case study
process model