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A simple on-chip repetitive sampling setup for the quantification of substrate noise.

Michiel De WildeWim MeeusPieter RomboutsJan Van Campenhout
Published in: IEEE J. Solid State Circuits (2006)
Keyphrases
  • sample size
  • random sampling
  • low cost
  • missing data
  • noisy data
  • random noise
  • real time
  • data sets
  • signal to noise ratio
  • noise model
  • image noise
  • noisy environments