A Low-Noise High Intrascene Dynamic Range CMOS Image Sensor With a 13 to 19b Variable-Resolution Column-Parallel Folding-Integration/Cyclic ADC.
Min-Woong SeoSungho SuhTetsuya IidaTaishi TakasawaKeigo IsobeTakashi WatanabeShinya ItohKeita YasutomiShoji KawahitoPublished in: IEEE J. Solid State Circuits (2012)
Keyphrases
- dynamic range
- cmos image sensor
- variable resolution
- signal to noise ratio
- wide dynamic range
- parallel processing
- high dynamic range
- single chip
- multiresolution
- low power consumption
- image sensor
- spatially varying
- transfer function
- solid state
- low power
- real time
- power consumption
- fully integrated
- image quality
- high speed
- low cost
- image processing