Contourlet and Nearest Feature Line Based Feature Extraction Approach for One Prototype Sample Problem.
Jeng-Shyang PanLijun YanShu-Chuan ChuJohn F. RoddickPublished in: J. Inf. Hiding Multim. Signal Process. (2016)
Keyphrases
- feature extraction
- nearest feature line
- image feature extraction
- discriminant analysis
- texture retrieval
- face recognition
- multiresolution
- image classification
- feature selection
- feature vectors
- support vector machine svm
- subband
- texture image retrieval
- image processing
- wavelet transform
- dimensionality reduction
- frequency domain
- pattern recognition
- data mining
- contourlet transform