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IC Discrimination via Novel S-Parameter Measurement Technique.

Derek JohnstonBrian NutterRichard O. Gale
Published in: I2MTC (2020)
Keyphrases
  • integrated circuit
  • parameter values
  • feature selection
  • wide range
  • feature space
  • single parameter
  • databases
  • decision making
  • knowledge base
  • multiscale
  • input parameters
  • optimal parameters