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Integrated test concepts for in-situ millimeter-wave device characterization.

Dietmar KissingerJohannes NehringAndreas OborovskiKarl BoruttaIsmail NasrBenjamin LaemmleRobert Weigel
Published in: NEWCAS (2015)
Keyphrases
  • millimeter wave
  • radar images
  • sar imagery
  • imaging process
  • image processing
  • parameter estimation
  • high quality