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Deep Learning Optimization for Edge Devices: Analysis of Training Quantization Parameters.

Alicja KwasniewskaMaciej SzankinMateusz OzgaJason WolfeArun DasAdam ZajacJacek RuminskiPaul Rad
Published in: IECON (2019)
Keyphrases
  • deep learning
  • pattern recognition
  • supervised learning
  • decision support system
  • maximum likelihood
  • unsupervised feature learning