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A Table-Based Approach to Study the Impact of Process Variations on FinFET Circuit Performance.
Rajesh Amratlal Thakker
Chaitanya Sathe
Maryam Shojaei Baghini
Mahesh B. Patil
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
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database
theoretical framework
statistical analysis
factors that influence
experimental study
simulation study
main factors
electronic circuits