Login / Signup
Pattern directed extraction and characterization of defect configurations in solid log models.
Luis G. Occeña
Jose M. A. Tanchoco
Published in:
Artif. Intell. Eng. (1989)
Keyphrases
</>
real time
real world
probabilistic model
three dimensional
pattern matching
experimental data
mathematical models
databases
information retrieval
artificial intelligence
feature selection
decision trees
database systems
automatic extraction