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Narrow Gap Detection in Microscope Images Using Marked Point Process Modeling.

Dae Woo KimCamilo AguilarHuixi ZhaoMary L. Comer
Published in: IEEE Trans. Image Process. (2019)
Keyphrases
  • microscope images
  • marked point process
  • object detection
  • feature selection
  • face recognition
  • feature extraction
  • gray level
  • cross sections