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Using Current Draw Analysis to Identify Suspicious Firmware Behavior in Solid State Drives.

Ryan McDowellRyan N. RakvicHau T. NgoT. Owens WalkerRobert W. IvesDane Brown
Published in: CSE/EUC (2019)
Keyphrases
  • solid state
  • image processing
  • random access
  • data analysis
  • digital images
  • high speed
  • multi dimensional