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One-Bit Measurements in Microwave Resonators.

Paolo CarboneMarco DionigiAlessio De AngelisAntonio MoschittaFrancesco SantoniValerio Brunacci
Published in: IEEE Trans. Instrum. Meas. (2024)
Keyphrases
  • measurement noise
  • measured data
  • knowledge base
  • image processing
  • computational complexity
  • digital images
  • block cipher