LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs.
Haiying YuanChangshi ZhouXun SunKai ZhangTong ZhengChang LiuXiuyu WangPublished in: J. Electron. Test. (2018)
Keyphrases
- low power
- nm technology
- power consumption
- vlsi architecture
- low cost
- high speed
- cmos technology
- mixed signal
- single chip
- high power
- wireless transmission
- low power consumption
- logic circuits
- vlsi circuits
- power dissipation
- image sensor
- digital signal processing
- real time
- signal processor
- image compression
- compression ratio
- power reduction
- data flow
- gate array
- vlsi implementation
- compression algorithm
- hardware and software
- cmos image sensor