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Characterization and Modeling of High Voltage MOS Robustness During Recirculation in Smart Power technologies.

Michele BassoMarco SambiAndrea Marcovati
Published in: ESSDERC (2023)
Keyphrases
  • high voltage
  • operating conditions
  • partial discharge
  • data sets
  • data mining
  • enabling technologies
  • active learning
  • ambient computing