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Vision-Based Metal Oxide Semiconductor Transistor-Level Layout Error Classification Using EfficientNet Model.

Lorena IlaganRonnie Concepcion IIMelvin K. CabatuanChristian Roque
Published in: ICSPCC (2020)
Keyphrases
  • classification models
  • probabilistic model
  • real time
  • decision trees
  • classification method
  • low cost
  • classification algorithm