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A Physics-Inspired Deep Learning Framework for an Efficient Fourier Ptychographic Microscopy Reconstruction under Low Overlap Conditions.

Lyes BouchamaBernadette DorizziJacques KlossaYaneck Gottesman
Published in: Sensors (2023)
Keyphrases
  • deep learning
  • high resolution
  • image reconstruction
  • machine learning
  • information retrieval
  • feature extraction
  • viewpoint
  • probabilistic model
  • unsupervised learning