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Invasiveness Estimation of Electro-Optic Probe in Electric Field.

Tomoya NaoeMasahiro YadaMitsuru ShinagawaYoshinori MatsumotoJun KatsuyamaHiroaki TanakaYoshiaki Tanaka
Published in: ICST (2018)
Keyphrases
  • electric field
  • electro optic
  • space charge
  • synthetic aperture imaging
  • parameter estimation
  • multiresolution
  • high quality
  • millimeter wave