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A SiC Power MOSFET Loss Model Suitable for High-Frequency Applications.

Xuan LiJunning JiangAlex Q. HuangSuxuan GuoXiaochuan DengBo ZhangXu She
Published in: IEEE Trans. Ind. Electron. (2017)
Keyphrases
  • high frequency
  • wavelet transform
  • high resolution
  • machine learning
  • subband
  • low frequency
  • wavelet decomposition