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Automated inspection and classification of flip-chip-contacts using scanning acoustic microscopy.
Sebastian Brand
P. Czurratis
P. Hoffrogge
Matthias Petzold
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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classification accuracy
machine learning methods
high speed
classification algorithm
classification systems
decision trees
pattern recognition
preprocessing
feature vectors
image analysis
class labels
text classification
neural network
automatic classification
classification scheme
feature extraction
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support vector machine
cost sensitive
training samples
model selection
hidden markov models
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image processing
machine learning