Automated inspection and classification of flip-chip-contacts using scanning acoustic microscopy.
Sebastian BrandP. CzurratisP. HoffroggeMatthias PetzoldPublished in: Microelectron. Reliab. (2010)
Keyphrases
- classification accuracy
- machine learning methods
- high speed
- classification algorithm
- classification systems
- decision trees
- pattern recognition
- preprocessing
- feature vectors
- image analysis
- class labels
- text classification
- neural network
- automatic classification
- classification scheme
- feature extraction
- classification process
- support vector machine
- cost sensitive
- training samples
- model selection
- hidden markov models
- feature space
- image processing
- machine learning