Clique Algorithm to Minimize Item Exposure for Uniform Test Forms Assembly.
Takatoshi IshiiMaomi UenoPublished in: AIED (2015)
Keyphrases
- preprocessing
- theoretical analysis
- high accuracy
- experimental evaluation
- optimization algorithm
- learning algorithm
- computational complexity
- detection algorithm
- times faster
- np hard
- significant improvement
- dynamic programming
- computational cost
- objective function
- optimal solution
- cost function
- simulated annealing
- input data
- particle swarm optimization
- expectation maximization
- recognition algorithm
- improved algorithm
- matching algorithm
- estimation algorithm
- probabilistic model
- computationally efficient
- linear programming
- data sets
- mobile robot
- genetic algorithm
- neural network