Investigating Reliability Aspects of Memristor based RRAM with Reference to Write Voltage and Frequency.

Tukaram D. Dongale K. V. Khot S. V. Mohite N. K. Desai S. S. Shinde A. V. Moholkar K. Y. Rajpure P. N. Bhosale P. S. Patil P. K. Gaikwad Rajanish K. Kamat

Published in: CoRR (2016)

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