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An Adversarial Active Sampling-based Data Augmentation Framework for Manufacturable Chip Design.

Mingjie LiuHaoyu YangZongyi LiKumara SastrySaumyadip MukhopadhyaySelim DogruAnima AnandkumarDavid Z. PanBrucek KhailanyHaoxing Ren
Published in: CoRR (2022)
Keyphrases
  • database
  • data sources
  • data analysis
  • databases
  • pattern recognition
  • knowledge discovery
  • state space
  • object oriented