Login / Signup
A proposed method for determining a MOSFET gate electrode's bottom dimension and the on-state fringing capacitance.
Shiuh-Wuu Lee
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1993)
Keyphrases
</>
experimental evaluation
significant improvement
high precision
synthetic data
detection method
high accuracy
mutual information
optimization method
segmentation method
clustering method
detection algorithm
optimization algorithm
decision trees
high speed
support vector machine
cost function
preprocessing