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2-D simulation of degenerate hot electron transport in MODFETs including DX center trapping.
Tarek Shawki
Georges Salmer
Osman El-Sayed
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1990)
Keyphrases
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simulation models
real time
x ray
numerical simulations
high fidelity