Flipchip Characterization for RF SOI Switch Model Improvement.
Kathleen MuhonenJayashree JayabalanScott ParkerPublished in: BCICTS (2023)
Keyphrases
- feature selection
- computational model
- input data
- machine learning
- high level
- prior knowledge
- decision making
- theoretical framework
- experimental data
- sensitivity analysis
- cost function
- probabilistic model
- management system
- high speed
- decision trees
- theoretical analysis
- mathematical model
- statistical model
- conceptual model
- linear model