CMOS Circuits for On-Chip Capacitance Ratio Testing or Sensor Readout.
Yuming CaoGabor C. TemesPublished in: ISCAS (1995)
Keyphrases
- high speed
- analog vlsi
- power dissipation
- focal plane
- low power
- cmos technology
- circuit design
- cmos image sensor
- chip design
- power consumption
- image sensor
- real time
- single chip
- logic circuits
- low cost
- vlsi circuits
- wide dynamic range
- sensor data
- infrared
- mixed signal
- sensor networks
- nm technology
- random access memory
- low power consumption
- delay insensitive
- imaging systems
- power reduction
- solid state
- digital signal processing
- dynamic range
- parallel processing
- high frequency
- signal processing