Revisiting supervised and unsupervised models for effort-aware just-in-time defect prediction.

Qiao Huang Xin Xia David Lo

Published in: Empir. Softw. Eng. (2019)

Keyphrases

unsupervised learning
semi supervised
supervised learning
model selection
defect prediction
probabilistic model
supervised classification
information systems
feature selection
data processing
statistical models
unsupervised feature selection