A junction characterization for microelectronic devices quality and reliability.

W. Tazibt P. Mialhe J. P. Charles M. A. Belkhir

Published in: Microelectron. Reliab. (2008)

Keyphrases

high quality
information retrieval
quality attributes
higher quality
learning algorithm
mobile devices
genetic algorithm
artificial intelligence
multiscale
data structure
user interface
mobile robot
embedded systems