Login / Signup

Investigating the TDDB lifetime growth mechanism caused by proton irradiation in partially depleted SOI devices.

Teng MaXuefeng YuJiangwei CuiQiwen ZhengHang ZhouDandan SuQi Guo
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • database
  • mobile devices
  • embedded systems
  • monte carlo simulation
  • neural network
  • multimedia
  • mobile agent system