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An enhanced on-wafer millimeter-wave noise parameter measurement system.
Paul Béland
Langis Roy
Sylvain Labonté
Malcolm Stubbs
Published in:
IEEE Trans. Instrum. Meas. (1999)
Keyphrases
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millimeter wave
imaging process
radar images
physical phenomena
sar imagery
image formation
imaging systems
video sequences
image data
wavelet transform
super resolution
automatic target recognition