Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain.
Franziska PöllerFélix Salazar BloiseMartin JakobiJie DongAlexander W. KochPublished in: Sensors (2021)
Keyphrases
- preprocessing
- computational cost
- high accuracy
- experimental evaluation
- fully automatic
- probabilistic model
- significant improvement
- prior knowledge
- pairwise
- cost function
- high precision
- dynamic programming
- similarity measure
- feature space
- computationally efficient
- synthetic data
- segmentation method
- computational complexity